PTL Fine Particle Analyst Rebecca Wolfrom publishes article in GXP [Spring 2011] Issue
The Journal of GXP Compliance - [Spring 2011] issue features an article by PTL's Analyst, Rebecca Wolfrom. Entitled The Language of Particle Size, this article addresses the importance in understanding how distributions and associated statistical terms relate to particle size analysis and subsequent compliance to specifications. To learn more about the Journal of GXP Compliance and this article, visit www.gxpandjvt.com.
The Language of Particle Size
Rebecca Wolfrom, Fine Particle Analyst I
ABSTRACT
The vocabulary of particle size analysis is unique and complex. Each sizing technology uses its own “language” for data expression and graphical representation. Clear understanding of the varying terminology is necessary for correct interpretation of the data. With this knowledge and understanding, a material’s compliance to established specifications can then be determined. This article will enable the reader to understand current particle size terminology and definitions, associated assumptions with different technologies, as well as the fundamental differences in graphical representations by histograms or cumulative distributions.
PTL Senior Chemist Eric Olson publishes article in JVT [Winter 2011] Issue
The Journal of Validation Technology - [Winter 2011] issue features an article by PTL's Senior Chemist, Eric Olson. Entitled Blending of Log Normal Particle Size Distribution Data from Multiple Image Analyses into a Single Continuous Data Set, this article addresses how to blend multiple image analyses in a useful continuous particle size distribution with optimal accuracy. To learn more about Journal of Validation Technology and this article, visit www.gxpandjvt.com.
Blending of Log Normal Particle Size Distribution Data from Multiple Image Analyses into a Single continuous Data Set
Eric Olson, Senior Chemist
ABSTRACT
Image analysis is one method by which particle size may be measured. In many cases, it is considered the “gold standard” of particle size measurement and is often used to verify the results of other techniques. Sample particle size distributions are often broad, sometimes covering two to three decades of particle diameter. It is also common to analyze samples that are multi-modal, e.g., a single sample that may contain primary particles and hard agglomerates with overlapping particle size distributions. Typical results when analyzing these samples are frequently inaccurate at the particle size extremes, depending on the instrument operating parameters used. This paper describes a methodology by which data from multiple image analyses that used different operational parameters are exported from the instrument into a suitable spreadsheet. The data are then be blended into a useful continuous particle size distribution with optimal accuracy.

PTL is pleased to announce that Bill Kopesky, Vice President of Analytical Services has been named to the Editorial Advisory Board for both The Journal of Validation Technology and The Journal of GXP Compliance.