PTL Fine Particle Analyst Rebecca Wolfrom publishes article in GXP [Spring 2011] Issue
The Journal of GXP Compliance - [Spring 2011] issue features an article by PTL's Analyst, Rebecca Wolfrom. Entitled The Language of Particle Size, this article addresses the importance in understanding how distributions and associated statistical terms relate to particle size analysis and subsequent compliance to specifications. To learn more about the Journal of GXP Compliance and this article, visit www.gxpandjvt.com.
The Language of Particle Size
Rebecca Wolfrom, Fine Particle Analyst I
ABSTRACT
The vocabulary of particle size analysis is unique and complex. Each sizing technology uses its own “language” for data expression and graphical representation. Clear understanding of the varying terminology is necessary for correct interpretation of the data. With this knowledge and understanding, a material’s compliance to established specifications can then be determined. This article will enable the reader to understand current particle size terminology and definitions, associated assumptions with different technologies, as well as the fundamental differences in graphical representations by histograms or cumulative distributions.
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